Samsung Electronics and Nova Jointly awarded the Vladimir Ukraintsev Award at the SPIE Advanced Lithography conference

REHOVOT, Israel, March 18, 2025 /PRNewswire/ -- Nova (Nasdaq: NVMI) today announced that its co-authored paper with Samsung Electronics on "On-Cell Thickness Monitoring of Chalcogenide Alloy Layer using Spectral Interferometry, Raman Spectroscopy, and Hybrid Machine Learning" has been selected as the winner of the Vladimir Ukraintsev Award for "Collaborations in Metrology" at SPIE's 2024 Advanced Lithography + Patterning Conference.The award was granted to Nova and Samsung on the opening day of the 2025 con ...